Proceedings of the 2008 workshop on Radiation effects and fault tolerance in nanometer technologies

Proceedings of the 2008 workshop on Radiation effects and fault tolerance in nanometer technologies

Bibliographische Detailangaben
Format:	Elektronisch Buch
Sprache:	English
Veröffentlicht:	Association for Computing Machinery (ACM), 5/5/08
Schlagworte:	Conference papers and proceedings.
Online Zugang:	Full text available on Research4Life (ACM)
Classic Catalogue:	View this record in Classic Catalogue

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