Reliability, Infocom Technologies and Optimization (ICRITO) (Trends and Future Directions), International Conference on

Reliability, Infocom Technologies and Optimization (ICRITO) (Trends and Future Directions), International Conference on

Xehetasun bibliografikoak
Formatua: Baliabide elektronikoa Liburua
Hizkuntza:English
Argitaratua: IEEE
Gaiak:
Communication, Networking and Broadcast Technologies; Computing and Processing; Engineering Profession; General Topics for Engineers
Conference papers and proceedings.
Sarrera elektronikoa:Full text available on IEEE [2017-2023]
Off-campus access
Classic Catalogue: View this record in Classic Catalogue

Internet

Full text available on IEEE [2017-2023]
Off-campus access

Antzeko izenburuak