2022 First International Workshop on Visualization in Testing of Hardware, Software, and Manufacturing (TestVis)
| Formaat: | Elektronisch Boek |
|---|---|
| Taal: | English |
| Gepubliceerd in: |
IEEE
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| Onderwerpen: | |
| Online toegang: | Full text available on IEEE [2017-2023] Off-campus access |
| Classic Catalogue: | View this record in Classic Catalogue |