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2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems

2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems

Dades bibliogràfiques
Format: Electrònic Llibre
Idioma:English
Publicat: IEEE
Matèries:
Computing and Processing; Components, Circuits, Devices and Systems; Communication, Networking and Broadcast Technologies
Conference papers and proceedings.
Accés en línia:Full text available on IEEE [2017-2023]
Off-campus access
Classic Catalogue: View this record in Classic Catalogue
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Full text available on IEEE [2017-2023]
Off-campus access

Ítems similars

  • 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)
  • 2022 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)
  • 2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS)
  • 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS)
  • 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)

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