Maricau. (2013). Analog IC Reliability in Nanometer CMOS (1.). Springer New York.
Cita Chicago (17th ed.)Maricau. Analog IC Reliability in Nanometer CMOS. 1. Springer New York, 2013.
Cita MLA (8th ed.)Maricau. Analog IC Reliability in Nanometer CMOS. 1. Springer New York, 2013.
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