Maricau. (2013). Analog IC Reliability in Nanometer CMOS (1.). Springer New York.
Chicago Style (17th ed.) CitationMaricau. Analog IC Reliability in Nanometer CMOS. 1. Springer New York, 2013.
MLA (8th ed.) CitationMaricau. Analog IC Reliability in Nanometer CMOS. 1. Springer New York, 2013.
Warning: These citations may not always be 100% accurate.