Optically Active Charge Traps and Chemical Defects in Semiconducting Nanocrystals Probed by Pulsed Optically Detected Magnetic Resonance

Bibliografski detalji
Glavni autor: van Schooten
Format: Elektronički e-knjiga
Jezik:English
Izdano: Springer International Publishing, 2013
Izdanje:1
Teme:
Online pristup:Full text available on Springer
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