van Schooten. (2013). Optically Active Charge Traps and Chemical Defects in Semiconducting Nanocrystals Probed by Pulsed Optically Detected Magnetic Resonance (1.). Springer International Publishing.
Чикаго стиль цитування (17-те видання)van Schooten. Optically Active Charge Traps and Chemical Defects in Semiconducting Nanocrystals Probed by Pulsed Optically Detected Magnetic Resonance. 1. Springer International Publishing, 2013.
Стиль цитування MLA (8-ме видання)van Schooten. Optically Active Charge Traps and Chemical Defects in Semiconducting Nanocrystals Probed by Pulsed Optically Detected Magnetic Resonance. 1. Springer International Publishing, 2013.
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