Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices IX
| Övriga upphovsmän: | Kullberg, Richard |
|---|---|
| Materialtyp: | Elektronisk Bok |
| Språk: | English |
| Publicerad: |
SPIE Digital Library,
2/4/10
|
| Ämnen: | |
| Länkar: | Full text available on Research4Life (SPIE Digital Library) |
| Classic Catalogue: | View this record in Classic Catalogue |
Liknande verk
- Reliability, Packaging, Testing, and Characterization of MOEMS/MEMS and Nanodevices XII
- Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices X
- Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices XI
- Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices VIII
- Reliability, Packaging, Testing, and Characterization of MOEMS/MEMS, Nanodevices, and Nanomaterials XIII