Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices IX
| Andere auteurs: | Kullberg, Richard |
|---|---|
| Formaat: | Elektronisch Boek |
| Taal: | English |
| Gepubliceerd in: |
SPIE Digital Library,
2/4/10
|
| Onderwerpen: | |
| Online toegang: | Full text available on Research4Life (SPIE Digital Library) |
| Classic Catalogue: | View this record in Classic Catalogue |
Gelijkaardige items
- Reliability, Packaging, Testing, and Characterization of MOEMS/MEMS and Nanodevices XII
- Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices X
- Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices XI
- Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices VIII
- Reliability, Packaging, Testing, and Characterization of MOEMS/MEMS, Nanodevices, and Nanomaterials XIII