APA (7th ed.) Citation

Kullberg, R. Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices IX. SPIE Digital Library.

Chicago Style (17th ed.) Citation

Kullberg, Richard. Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices IX. SPIE Digital Library.

MLA (8th ed.) Citation

Kullberg, Richard. Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices IX. SPIE Digital Library.

Warning: These citations may not always be 100% accurate.