Instrumentation, Metrology, and Standards for Nanomanufacturing III
| Other Authors: | Postek, Michael |
|---|---|
| Format: | Electronic Book |
| Language: | English |
| Published: |
SPIE Digital Library,
8/20/09
|
| Subjects: | |
| Online Access: | Full text available on Research4Life (SPIE Digital Library) |
| Classic Catalogue: | View this record in Classic Catalogue |
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