Postek, M. Instrumentation, Metrology, and Standards for Nanomanufacturing II. SPIE Digital Library.
Chicago Style (17. basım) AtıfPostek, Michael. Instrumentation, Metrology, and Standards for Nanomanufacturing II. SPIE Digital Library.
MLA (8th ed.) AtıfPostek, Michael. Instrumentation, Metrology, and Standards for Nanomanufacturing II. SPIE Digital Library.
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