Instrumentation, Metrology, and Standards for Nanomanufacturing
| অন্যান্য লেখক: | Postek, Michael |
|---|---|
| বিন্যাস: | বৈদ্যুতিক গ্রন্থ |
| ভাষা: | English |
| প্রকাশিত: |
SPIE Digital Library,
9/10/07
|
| বিষয়গুলি: | |
| অনলাইন ব্যবহার করুন: | Full text available on Research4Life (SPIE Digital Library) |
| Classic Catalogue: | View this record in Classic Catalogue |
অনুরূপ উপাদানগুলি
- Instrumentation, Metrology, and Standards for Nanomanufacturing III
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- Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors VII