Testing, Reliability, and Application of Micro- and Nano-Material Systems IV

Bibliografiske detaljer
Andre forfattere: Geer, Robert
Format: Electronisk Bog
Sprog:English
Udgivet: SPIE Digital Library, 3/16/06
Fag:
Online adgang:Full text available on Research4Life (SPIE Digital Library)
Classic Catalogue: View this record in Classic Catalogue
Beskrivelse
Emne beskrivelse:<strong>On-Campus Access Only (IP based access)</strong>
Fysisk beskrivelse:1 online resource
Format:Mode of access: Internet
ISBN:9780819462282
Adgang:Electronic access restricted to authorized BRAC University faculty, staff and students