Testing, Reliability, and Application of Micro- and Nano-Material Systems III
| Další autoři: | Geer, Robert |
|---|---|
| Médium: | Elektronický zdroj Kniha |
| Jazyk: | English |
| Vydáno: |
SPIE Digital Library,
5/9/05
|
| Témata: | |
| On-line přístup: | Full text available on Research4Life (SPIE Digital Library) |
| Classic Catalogue: | View this record in Classic Catalogue |
Podobné jednotky
- Testing, Reliability, and Application of Micro- and Nano-Material Systems
- Testing, Reliability, and Application of Micro- and Nano-Material Systems II
- Testing, Reliability, and Application of Micro- and Nano-Material Systems IV
- Micro/Nano Materials, Devices, and Systems
- Micro+Nano Materials, Devices, and Systems