Testing, Reliability, and Application of Micro- and Nano-Material Systems III

Détails bibliographiques
Autres auteurs: Geer, Robert
Format: Électronique Livre
Langue:English
Publié: SPIE Digital Library, 5/9/05
Sujets:
Accès en ligne:Full text available on Research4Life (SPIE Digital Library)
Classic Catalogue: View this record in Classic Catalogue
Description
Description:<strong>On-Campus Access Only (IP based access)</strong>
Description matérielle:1 online resource
Format:Mode of access: Internet
ISBN:9780819457479
Accès:Electronic access restricted to authorized BRAC University faculty, staff and students