APA引文

Gorecki, C. Microsystems Engineering: Metrology and Inspection III. SPIE Digital Library.

Chicago Style (17th ed.) Citation

Gorecki, Christophe. Microsystems Engineering: Metrology and Inspection III. SPIE Digital Library.

MLA引文

Gorecki, Christophe. Microsystems Engineering: Metrology and Inspection III. SPIE Digital Library.

警告：這些引文格式不一定是100％准確.