Citace podle APA (7th ed.)

Tobin, K. Process and Materials Characterization and Diagnostics in IC Manufacturing. SPIE Digital Library.

Citace podle Chicago (17th ed.)

Tobin, Kenneth. Process and Materials Characterization and Diagnostics in IC Manufacturing. SPIE Digital Library.

Citace podle MLA (8th ed.)

Tobin, Kenneth. Process and Materials Characterization and Diagnostics in IC Manufacturing. SPIE Digital Library.

Upozornění: Tyto citace jsou generovány automaticky. Nemusí být zcela správně podle citačních pravidel..