APA (7th ed.) Citation

Kissinger, G. In-Line Characterization, Yield, Reliability, and Failure Analysis in Microelectronic Manufacturing II. SPIE Digital Library.

Chicago Style (17th ed.) Citation

Kissinger, Gudrun. In-Line Characterization, Yield, Reliability, and Failure Analysis in Microelectronic Manufacturing II. SPIE Digital Library.

MLA (8th ed.) Citation

Kissinger, Gudrun. In-Line Characterization, Yield, Reliability, and Failure Analysis in Microelectronic Manufacturing II. SPIE Digital Library.

Warning: These citations may not always be 100% accurate.