Цитирование APA (7-е изд.)

Kissinger, G. In-Line Characterization, Yield, Reliability, and Failure Analysis in Microelectronic Manufacturing II. SPIE Digital Library.

Цитирование в стиле Чикаго (17-е изд.)

Kissinger, Gudrun. In-Line Characterization, Yield, Reliability, and Failure Analysis in Microelectronic Manufacturing II. SPIE Digital Library.

Цитирование MLA (8-е изд.)

Kissinger, Gudrun. In-Line Characterization, Yield, Reliability, and Failure Analysis in Microelectronic Manufacturing II. SPIE Digital Library.

Предупреждение: эти цитированмия не могут быть всегда правильны на 100%.