Microelectronic Yield, Reliability, and Advanced Packaging

Bibliografiske detaljer
Andre forfattere: Tan, Cherming
Format: Electronisk Bog
Sprog:English
Udgivet: SPIE Digital Library, 10/23/00
Fag:
Online adgang:Full text available on Research4Life (SPIE Digital Library)
Classic Catalogue: View this record in Classic Catalogue

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