MEMS Reliability for Critical Applications
| Muut tekijät: | Lawton, Russell |
|---|---|
| Aineistotyyppi: | Elektroninen Kirja |
| Kieli: | English |
| Julkaistu: |
SPIE Digital Library,
8/10/00
|
| Aiheet: | |
| Linkit: | Full text available on Research4Life (SPIE Digital Library) |
| Classic Catalogue: | View this record in Classic Catalogue |
Samankaltaisia teoksia
- MEMS Reliability for Critical and Space Applications
- Reliability, Testing, and Characterization of MEMS/MOEMS
- Reliability, Testing, and Characterization of MEMS/MOEMS II
- Reliability, Testing, and Characterization of MEMS/MOEMS III
- Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS VI