Batchelor, B. Machine Vision Systems for Inspection and Metrology VII. SPIE Digital Library.
Style de citation Chicago (17e éd.)Batchelor, Bruce. Machine Vision Systems for Inspection and Metrology VII. SPIE Digital Library.
Style de citation MLA (8e éd.)Batchelor, Bruce. Machine Vision Systems for Inspection and Metrology VII. SPIE Digital Library.
Attention : ces citations peuvent ne pas être correctes à 100%.