Prasad, S. Microelectronic Manufacturing Yield, Reliability, and Failure Analysis IV. SPIE Digital Library.
Citazione stile Chigago Style (17a edizione)Prasad, Sharad. Microelectronic Manufacturing Yield, Reliability, and Failure Analysis IV. SPIE Digital Library.
Citatione MLA (8a ed.)Prasad, Sharad. Microelectronic Manufacturing Yield, Reliability, and Failure Analysis IV. SPIE Digital Library.
Attenzione: Queste citazioni potrebbero non essere precise al 100%.