Ajuria, S. In-Line Characterization Techniques for Performance and Yield Enhancement in Microelectronic Manufacturing II. SPIE Digital Library.
শিকাগো স্টাইল (17 তম সংস্করণ) উদ্ধৃতিAjuria, Sergio. In-Line Characterization Techniques for Performance and Yield Enhancement in Microelectronic Manufacturing II. SPIE Digital Library.
M.L.A (8 ম সংস্করণ) উদ্ধৃতিAjuria, Sergio. In-Line Characterization Techniques for Performance and Yield Enhancement in Microelectronic Manufacturing II. SPIE Digital Library.
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