Microelectronic Manufacturing Yield, Reliability, and Failure Analysis III
| مؤلفون آخرون: | |
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| التنسيق: | الكتروني كتاب |
| اللغة: | English |
| منشور في: |
SPIE Digital Library,
9/11/97
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| الموضوعات: | |
| الوصول للمادة أونلاين: | Full text available on Research4Life (SPIE Digital Library) |
| Classic Catalogue: | View this record in Classic Catalogue |
| وصف المادة: | <strong>On-Campus Access Only (IP based access)</strong> |
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| وصف مادي: | 1 online resource |
| التنسيق: | Mode of access: Internet |
| ردمك: | 9780819426482 |
| وصول: | Electronic access restricted to authorized BRAC University faculty, staff and students |