Keshavarzi, A. Microelectronic Manufacturing Yield, Reliability, and Failure Analysis III. SPIE Digital Library.
Citace podle Chicago (17th ed.)Keshavarzi, Ali. Microelectronic Manufacturing Yield, Reliability, and Failure Analysis III. SPIE Digital Library.
Citace podle MLA (8th ed.)Keshavarzi, Ali. Microelectronic Manufacturing Yield, Reliability, and Failure Analysis III. SPIE Digital Library.
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