Cita APA (7th ed.)

Keshavarzi, A. Microelectronic Manufacturing Yield, Reliability, and Failure Analysis III. SPIE Digital Library.

Cita Chicago (17th ed.)

Keshavarzi, Ali. Microelectronic Manufacturing Yield, Reliability, and Failure Analysis III. SPIE Digital Library.

Cita MLA (8th ed.)

Keshavarzi, Ali. Microelectronic Manufacturing Yield, Reliability, and Failure Analysis III. SPIE Digital Library.

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