Starikov, A. Metrology, Inspection, and Process Control for Microlithography XXVI. SPIE Digital Library.
Chicago Style (17th ed.) CitationStarikov, Alexander. Metrology, Inspection, and Process Control for Microlithography XXVI. SPIE Digital Library.
ציטוט MLAStarikov, Alexander. Metrology, Inspection, and Process Control for Microlithography XXVI. SPIE Digital Library.
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