Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices XI
| Інші автори: | |
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| Формат: | Електронний ресурс Книга |
| Мова: | English |
| Опубліковано: |
SPIE Digital Library,
3/16/12
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| Предмети: | |
| Онлайн доступ: | Full text available on Research4Life (SPIE Digital Library) |
| Classic Catalogue: | View this record in Classic Catalogue |