APA-viite (7. p.)

García-Blanco, S. Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices XI. SPIE Digital Library.

Chicago-viite (17. p.)

García-Blanco, Sonia. Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices XI. SPIE Digital Library.

MLA-viite (8. p.)

García-Blanco, Sonia. Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices XI. SPIE Digital Library.

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