Postek, M. Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors V. SPIE Digital Library.
Cita Chicago (17th ed.)Postek, Michael. Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors V. SPIE Digital Library.
Cita MLA (8th ed.)Postek, Michael. Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors V. SPIE Digital Library.
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