Postek, M. Scanning Microscopies 2011: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences. SPIE Digital Library.
Cita Chicago (17th ed.)Postek, Michael. Scanning Microscopies 2011: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences. SPIE Digital Library.
Cita MLA (8th ed.)Postek, Michael. Scanning Microscopies 2011: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences. SPIE Digital Library.
Atenció: Aquestes cites poden no estar 100% correctes.