Raymond, C. Metrology, Inspection, and Process Control for Microlithography XXV. SPIE Digital Library.
Cita Chicago (17th ed.)Raymond, Christopher. Metrology, Inspection, and Process Control for Microlithography XXV. SPIE Digital Library.
Cita MLA (8th ed.)Raymond, Christopher. Metrology, Inspection, and Process Control for Microlithography XXV. SPIE Digital Library.
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