Scanning Microscopies 2013: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences

Bibliographic Details
Other Authors: Postek, Michael
Format: Electronic Book
Language:English
Published: SPIE Digital Library, 6/6/13
Subjects:
Online Access:Full text available on Research4Life (SPIE Digital Library)
Classic Catalogue: View this record in Classic Catalogue

Similar Items