Reliability, Packaging, Testing, and Characterization of MOEMS/MEMS and Nanodevices XII
| Andre forfattere: | Ramesham, Rajeshuni |
|---|---|
| Format: | Electronisk Bog |
| Sprog: | English |
| Udgivet: |
SPIE Digital Library,
3/26/13
|
| Fag: | |
| Online adgang: | Full text available on Research4Life (SPIE Digital Library) |
| Classic Catalogue: | View this record in Classic Catalogue |
Lignende værker
- Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices X
- Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices XI
- Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices IX
- Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices VIII
- Reliability, Packaging, Testing, and Characterization of MOEMS/MEMS, Nanodevices, and Nanomaterials XIII