Scanning Microscopies 2012: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences

Detalhes bibliográficos
Outros Autores: Postek, Michael
Formato: Recurso Electrónico Livro
Idioma:English
Publicado em: SPIE Digital Library, 6/5/12
Assuntos:
Acesso em linha:Full text available on Research4Life (SPIE Digital Library)
Classic Catalogue: View this record in Classic Catalogue

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