Postek, M. Scanning Microscopies 2012: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences. SPIE Digital Library.
Chicago Style (17th ed.) CitationPostek, Michael. Scanning Microscopies 2012: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences. SPIE Digital Library.
MLA (8th ed.) CitationPostek, Michael. Scanning Microscopies 2012: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences. SPIE Digital Library.
Warning: These citations may not always be 100% accurate.