Optical Metrology and Inspection for Industrial Applications IV

Detalles Bibliográficos
Otros Autores: Han, Sen
Formato: Electrónico Libro
Lenguaje:English
Publicado: SPIE Digital Library, 11/24/16
Materias:
Acceso en línea:Full text available on Research4Life (SPIE Digital Library)
Classic Catalogue: View this record in Classic Catalogue
Descripción
Notas:<strong>On-Campus Access Only (IP based access)</strong>
Descripción Física:1 online resource
Formato:Mode of access: Internet
ISBN:9781510604650
9781510604667
Acceso:Electronic access restricted to authorized BRAC University faculty, staff and students