Glembocki, O. Modern Optical Characterization Techniques for Semiconductors and Semiconductor Devices. SPIE Digital Library.
Citace podle Chicago (17th ed.)Glembocki, Orest. Modern Optical Characterization Techniques for Semiconductors and Semiconductor Devices. SPIE Digital Library.
Citace podle MLA (8th ed.)Glembocki, Orest. Modern Optical Characterization Techniques for Semiconductors and Semiconductor Devices. SPIE Digital Library.
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