Metrology, Inspection, and Process Control for Microlithography XXXI

Bibliografske podrobnosti
Drugi avtorji: Sanchez, Martha
Format: Elektronski Knjiga
Jezik:English
Izdano: SPIE Digital Library, 5/10/17
Teme:
Online dostop:Full text available on Research4Life (SPIE Digital Library)
Classic Catalogue: View this record in Classic Catalogue
Opis
Opis knjige/članka:<strong>On-Campus Access Only (IP based access)</strong>
Fizični opis:1 online resource
Format:Mode of access: Internet
ISBN:9781510607415
9781510607422
Dostop:Electronic access restricted to authorized BRAC University faculty, staff and students