Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology
| Päätekijä: | Shahriar, Selim M. |
|---|---|
| Aineistotyyppi: | Elektroninen Kirja |
| Kieli: | English |
| Julkaistu: |
SPIE Digital Library,
1/1/19
|
| Aiheet: | |
| Linkit: | Full text available on Research4Life (SPIE Digital Library) |
| Classic Catalogue: | View this record in Classic Catalogue |
Samankaltaisia teoksia
- Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology
- Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology II
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- Slow Light, Fast Light, and Opto-Atomic Precision Metrology VIII
- Slow Light, Fast Light, and Opto-Atomic Precision Metrology X