Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology
| Hoofdauteur: | |
|---|---|
| Formaat: | Elektronisch Boek |
| Taal: | English |
| Gepubliceerd in: |
SPIE Digital Library,
1/1/19
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| Onderwerpen: | |
| Online toegang: | Full text available on Research4Life (SPIE Digital Library) |
| Classic Catalogue: | View this record in Classic Catalogue |