Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology
| Weitere Verfasser: | |
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| Format: | Elektronisch Buch |
| Sprache: | English |
| Veröffentlicht: |
SPIE Digital Library,
4/15/19
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| Schlagworte: | |
| Online Zugang: | Full text available on Research4Life (SPIE Digital Library) |
| Classic Catalogue: | View this record in Classic Catalogue |