Automated Visual Inspection and Machine Vision IV

Bibliografske podrobnosti
Drugi avtorji: Beyerer, Jürgen
Format: Elektronski Knjiga
Jezik:English
Izdano: SPIE Digital Library, 6/30/21
Teme:
Online dostop:Full text available on Research4Life (SPIE Digital Library)
Classic Catalogue: View this record in Classic Catalogue

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