Citace podle APA (7th ed.)

Adan, O. Metrology, Inspection, and Process Control for Semiconductor Manufacturing XXXV. SPIE Digital Library.

Citace podle Chicago (17th ed.)

Adan, Ofer. Metrology, Inspection, and Process Control for Semiconductor Manufacturing XXXV. SPIE Digital Library.

Citace podle MLA (8th ed.)

Adan, Ofer. Metrology, Inspection, and Process Control for Semiconductor Manufacturing XXXV. SPIE Digital Library.

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