Metrology, Inspection, and Process Control for Microlithography XXXIV

Bibliographic Details
Other Authors: Adan, Ofer
Format: Electronic Book
Language:English
Published: SPIE Digital Library, 4/10/20
Subjects:
Online Access:Full text available on Research4Life (SPIE Digital Library)
Classic Catalogue: View this record in Classic Catalogue
Description
Item Description:<strong>On-Campus Access Only (IP based access)</strong>
Physical Description:1 online resource
Format:Mode of access: Internet
ISBN:9781510634176
9781510634183
Access:Electronic access restricted to authorized BRAC University faculty, staff and students