Advances in Metrology for X-Ray and EUV Optics X

Bibliographic Details
Other Authors: Assoufid, Lahsen
Format: Electronic Book
Language:English
Published: SPIE Digital Library, 1/1/21
Subjects:
Online Access:Full text available on Research4Life (SPIE Digital Library)
Classic Catalogue: View this record in Classic Catalogue
Description
Item Description:<strong>On-Campus Access Only (IP based access)</strong>
Physical Description:1 online resource
Format:Mode of access: Internet
ISBN:9781510666047
9781510666054
Access:Electronic access restricted to authorized BRAC University faculty, staff and students