8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Subnanometer Accuracy Measurement for Synchrotron Optics and X-Ray Optics
| Andre forfattere: | |
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| Format: | Electronisk Bog |
| Sprog: | English |
| Udgivet: |
SPIE Digital Library,
1/1/16
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| Fag: | |
| Online adgang: | Full text available on Research4Life (SPIE Digital Library) |
| Classic Catalogue: | View this record in Classic Catalogue |