SPECKLE 2015: VI International Conference on Speckle Metrology

SPECKLE 2015: VI International Conference on Speckle Metrology

Bibliografiske detaljer
Andre forfattere:	Torres, Annette
Format:	Electronisk Bog
Sprog:	English
Udgivet:	SPIE Digital Library, 8/24/15
Fag:	Conference papers and proceedings.
Online adgang:	Full text available on Research4Life (SPIE Digital Library)
Classic Catalogue:	View this record in Classic Catalogue

Lignende værker

Speckle 2018: VII International Conference on Speckle Metrology

Speckle 2012: V International Conference on Speckle Metrology

Photomechanics and Speckle Metrology

Speckle Metrology 2003

Speckle 2010: Optical Metrology

Speckle06: Speckles, From Grains to Flowers

Second International Conference on Photomechanics and Speckle Metrology

Handbook of Speckle Interferometry
af: Davila, Abundio
Udgivet: (2022)

Applications of Speckle Phenomena

Simulating Speckle with Mathematica
af: Goodman, Joseph W.

Simulating Speckle with Python
af: Goodman, Joseph W.

Intl Conf on Speckle

Handbook of Speckle Interferometry
af: Davila, Abundio

Robust Speckle Metrology Techniques for Stress Analysis and NDT
af: Viotti, Matias R.
Udgivet: (2014)

Robust Speckle Metrology Techniques for Stress Analysis and NDT
af: Viotti, Matias R.

Industrial Applications of Holographic and Speckle Measuring Techniques

Speckle Phenomena in Optics: Theory and Applications, Second Edition
af: Goodman, Joseph W.
Udgivet: (2020)

Speckle Phenomena in Optics: Theory and Applications, Second Edition
af: Goodman, Joseph W.

Electronic speckle pattern interferometry and related techniques using digital still cameras
af: Abedin, K.M., et al.
Udgivet: (2017)

2011 International Conference on Optical Instruments and Technology: Solid State Lighting and Display Technologies, Holography, Speckle Pattern Interferometry, and Micro/Nano Manufacturing and Metrology

Optical Fabrication, Testing, and Metrology VI

Modeling Aspects in Optical Metrology VI

Optical Metrology and Inspection for Industrial Applications VI

Advances in Metrology for X-Ray and EUV Optics VI

Dimensional Optical Metrology and Inspection for Practical Applications VI

Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors VI

Integrated Circuit Metrology, Inspection, and Process Control VI

Two- and Three-Dimensional Methods for Inspection and Metrology VI

Metrology and Metrology Assurance (MMA), International Scientific Symposium

2015 IEEE Metrology for Aerospace (MetroAeroSpace)

Interferometric Metrology

Optoelectronic Metrology

International Conference on Applied Optical Metrology

2021 XXXI International Scientific Symposium Metrology and Metrology Assurance (MMA)

2019 XXIX International Scientific Symposium "Metrology and Metrology Assurance" (MMA)

2020 XXX International Scientific Symposium 'Metrology and Metrology Assurance (MMA)

2022 XXXII International Scientific Symposium Metrology and Metrology Assurance (MMA)

Optical Testing and Metrology

Microlithography and Metrology in Micromachining

Precision Surface Metrology