Jones, S. Metrology, Inspection, and Process Control for Microlithography X. SPIE Digital Library.
Chicago Style (17th ed.) CitationJones, Susan. Metrology, Inspection, and Process Control for Microlithography X. SPIE Digital Library.
MLA (8th ed.) CitationJones, Susan. Metrology, Inspection, and Process Control for Microlithography X. SPIE Digital Library.
Warning: These citations may not always be 100% accurate.