APA (7e ed.) Bronvermelding

Seeger, D. Electron-Beam, X-Ray, EUV, and Ion-Beam Submicrometer Lithographies for Manufacturing VI. SPIE Digital Library.

Chicago (17e ed.) Bronvermelding

Seeger, David. Electron-Beam, X-Ray, EUV, and Ion-Beam Submicrometer Lithographies for Manufacturing VI. SPIE Digital Library.

MLA (8e ed.) Bronvermelding

Seeger, David. Electron-Beam, X-Ray, EUV, and Ion-Beam Submicrometer Lithographies for Manufacturing VI. SPIE Digital Library.

Let op: Deze citaties zijn niet altijd 100% accuraat.