Cita APA

Chiang, F. Second International Conference on Photomechanics and Speckle Metrology. SPIE Digital Library.

Citación estilo Chicago

Chiang, Fu-Pen. Second International Conference on Photomechanics and Speckle Metrology. SPIE Digital Library.

Cita MLA

Chiang, Fu-Pen. Second International Conference on Photomechanics and Speckle Metrology. SPIE Digital Library.

Warning: These citations may not always be 100% accurate.