Proceedings of the 2000 ACM SIGSOFT international symposium on Software testing and analysis

Détails bibliographiques
Autres auteurs: Harold
Format: Électronique Livre
Langue:English
Publié: Association for Computing Machinery (ACM), 8/1/00
Sujets:
Accès en ligne:Full text available on Research4Life (ACM)
Classic Catalogue: View this record in Classic Catalogue
Description
Description:<strong>On-Campus Access Only (IP based access)</strong>
Description matérielle:1 online resource
Format:Mode of access: Internet
ISBN:9781581132663
Accès:Electronic access restricted to authorized BRAC University faculty, staff and students